Ellipsometric determination of optical constants of metals; a contribution to reflectivity standards for ore microscopy

Indexes of refraction and absorption coefficients were determined for polished surfaces of silicon, tungsten, nickel, and aluminum by means of extinction measurements in elliptically polarized light. Measurements were made at wavelengths of 4,860, 5,460, 5,890, and 6,200 angstroms. Reflectivities, at normal incidence, were calculated from the indexes of refraction and absorption coefficients. Results on tungsten and nickel were close to reflectivities measured photometrically in another laboratory. Results on silicon differed by a maximum of 3.3 percent of the reflectivities measured photometrically.