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Peter M. Sachs
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Journal Article

Synchrotron-XRF microprobe analysis of silicate reference standards using fundamental-parameter quantification

Thor H. HANSTEEN, Peter M. SACHS, Frank LECHTENBERG
Published: 01 January 2000
European Journal of Mineralogy (2000) 12 (1): 25–31.
DOI: https://doi.org/10.1127/0935-1221/2000/0012-0025
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