A century has passed since the first X-ray diffraction experiment (Friedrich et al. 1912). During this time, X-ray diffraction has become a commonly used technique for the identification and characterization of materials and the field has seen continuous development. Advances in the theory of diffraction, in the generation of X-rays, in techniques and data analysis tools changed the ways X-ray diffraction is performed, the quality of the data analysis, and expanded the range of samples and problems that can be addressed. X-ray diffraction was first applied exclusively to crystalline structures idealized as perfect, rigid, space and time averaged...

First Page Preview

First page PDF preview
You do not currently have access to this article.