A century has passed since the first X-ray diffraction experiment (Friedrich et al. 1912). During this time, X-ray diffraction has become a commonly used technique for the identification and characterization of materials and the field has seen continuous development. Advances in the theory of diffraction, in the generation of X-rays, in techniques and data analysis tools changed the ways X-ray diffraction is performed, the quality of the data analysis, and expanded the range of samples and problems that can be addressed. X-ray diffraction was first applied exclusively to crystalline structures idealized as perfect, rigid, space and time averaged...

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