Secondary ion mass spectrometry (SIMS) is a versatile technique for measuring the chemical and isotopic composition of solid materials on a scale of a few microns. A beam of high-energy primary ions is focused onto the polished target surface, sputtering (ablating) atoms and molecules, and in the process ionizing a small fraction. These secondary ions, which reflect the target composition, are analyzed by mass spectrometry. The SIMS instrument most common in geoscience is the ion microprobe, which uses a focused primary ion beam in either static or scanning mode to sample target areas usually 10- to 50-μm diameter. Total sampling...
Research Article|January 02, 2003
Considerations in Zircon Geochronology by SIMS
Trevor R. Ireland
Reviews in Mineralogy and Geochemistry (2003) 53 (1): 215-241.