Secondary ion mass spectrometry (SIMS, or ion microprobe) represents an extremely sensitive technique for the microanalysis of beryllium. Positive ions of beryllium are readily formed and its analysis by SIMS is not overly complicated. Matrix effects appear to be small (<20%). In this chapter I will describe SIMS instrumentation, the problems facing Be analysis, solutions to these problems, calibrations for Be and limits of detection.

As of the writing of this chapter (mid-2000), SIMS instruments broadly useful to geochemists are commercially available from two companies. Australian Scientific Instruments (ASI, at sells the SHRIMP (Super High Resolution Ion Micro...

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