Abstract
Integrated (IINT) and peak (IPK) intensities are calculated from single-crystal structure analyses for maximum microcline (granitic and authigenic), intermediate microcline, ortho-clase, adularía, high sanidine and celsian. Graphical representation of the intensities distributed over Cauchy profiles results in plots which are very similar to comparable experimental X-ray diffraction traces over the whole 2θ range. Apparent differences in peak heights in the calculated and experimental patterns can be related to preferred orientations of crystals in standard mounts because of cleavage production during grinding.
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