Abstract

As an aid in indexing complex plagioclase X-ray powder patterns, integrated (IINT) and peak (IP) intensities are calculated for five plagioclases [low and high albite (An0), oligoclase (An29), bytownite (An80) and anorthite (An100)]. Lorentz-polarization, absorption and multiplicity corrections appropriate to powder mounts are applied to temperature-corrected │F2 which are calculated from single-crystal structure analyses. Graphical expression of IP as a function of 2θ results in plots which are very similar to the comparable experimental X-ray diffraction traces.

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