Electron backscatter diffraction (EBSD) is a form of divergent beam electron diffraction in which electrons scattered from a solid specimen mounted in a scanning electron microscope (SEM) form a ‘Kikuchi pattern’ containing a network of lines representing Bragg reflections from crystal planes. EBSD has come to full fruition in the last few years, as a result of the development of sensitive CCD recording systems, advances in computer hardware, and software for processing the patterns, and the availability of commercial systems ‘off the shelf’. Compared to electron diffraction in the transmission electron microscope, SEM/EBSD is faster and specimen preparation is much...

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