Mapping terrestrial impact craters with the TanDEM-X digital elevation model
Published:October 01, 2015
Manfred Gottwald, Thomas Fritz, Helko Breit, Birgit Schättler, Alan Harris, 2015. "Mapping terrestrial impact craters with the TanDEM-X digital elevation model", Large Meteorite Impacts and Planetary Evolution V, Gordon R. Osinski, David A. Kring
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The TanDEM-X digital elevation model (DEM), generated by the TanDEM-X mission, provides a unique opportunity for studying the topography and morphology of terrestrial impact structures. In the TanDEM-X mission, the two Earth-orbiting X-band radar satellites TerraSAR-X and TanDEM-X are operated in close formation to act as a single-pass interferometer. Interferometric processing of the acquired data yields a global DEM with unprecedented accuracy of better than 4 m and a spatial resolution of 12 m. We investigate how the TanDEM-X DEM can be used for mapping terrestrial impact structures by applying it to the confirmed impact craters in the Earth Impact...