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thin-film analysis

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Journal Article

Thin-film analysis of clay particles using energy dispersive X-ray analysis Available to Purchase

G. N. White, V. E. Berkheiser, F. N. Blanchard, C. T. Hallmark
Published: 01 October 1982
Clays and Clay Minerals (1982) 30 (5): 375–382.
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Journal Article

Applications of electron microscopy in metamorphic and structural geology Available to Purchase

K. H. Brodie
Published: 01 January 1984
Journal of the Geological Society (1984) 141 (1): 187–190.
DOI: https://doi.org/10.1144/gsjgs.141.1.0187
... makes these techniques ideal for application to metamorphic rocks. Champness introduced the method of thin film analysis, contrasting this with conventional electron probe microanalysis and noting some of the problems involved and how they could be minimized. As an example of the applications...
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Journal Article

X-ray diffraction analysis of thin clay films from dilute suspensions using glancing incidence diffraction Available to Purchase

Katherine Ozalas, Benjamin F. Hajek
Published: 01 December 1996
Clays and Clay Minerals (1996) 44 (6): 811–817.
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Add to Citation Manager for X-ray diffraction <span class="search-highlight">analysis</span> of <span class="search-highlight">thin</span> clay <span class="search-highlight">films</span> from dilute suspensions using glancing incidence diffraction
Image
Cost-effective thin-section scanning setup. (A) Plustek OpticFilm 8100/8200i SE film scanner. (B)–(C) 3D-printed sample holder, with removable polarizing films, displaying a sample (TF-03 from Leung 2019) in (B) non-polarized light and (C) circularly polarized light (CPL). (D)–(G) Comparison of the same thin section under CPL, scanned using (D) and inset (E) Plustek OpticFilm 8100/8200i SE versus (F) and inset (G) Nikon Super COOLSCAN 5000 ED film scanners. The rose diagrams on the bottom left of (D) and (F) show the shape-preferred orientation of plagioclase and were tabulated via digital image analysis of the same thin section, scanned under plane-polarized light (see Leung 2019). This illustrates how digital image analysis of entire thin-section scans can be used to quantify textures. The inset images (E) and (G) feature clinopyroxene grains, showing that both methods produce comparable image resolution and quality. The field of view (∼1.5 mm) is equivalent to that of a photomicrograph taken with a standard petrographic microscope under 10× objective magnification.

Cost-effective thin-section scanning setup. (A) Plustek OpticFilm 8100/8200... Available to Purchase

Published: 29 September 2023
Fig. 1. Cost-effective thin-section scanning setup. (A) Plustek OpticFilm 8100/8200i SE film scanner. (B)–(C) 3D-printed sample holder, with removable polarizing films, displaying a sample (TF-03 from Leung 2019 ) in (B) non-polarized light and (C) circularly polarized light (CPL). (D)–(G
Image
Comparison of measured “meas” and calculated “calc.” absorption spectra of the lattice modes. Heavy solid and dotted lines, left y-axis = IR thin film absorbance spectra, using natural logarithm units. Thin lines, right y-axis = absorption coefficient calculated from Kramers-Kronig analysis. (a) Py100. Dots = mid-IR thin-film of natural pyrope. HC = hydrocarbon contaminants. F = interference fringes. O.T. = overtones. From the comparison, the pyrope films have thickness of about 0.2 μm. (b) Mj39. Thickness ~1 μm. (c) Mj45. Thickness ~0.4 μm. (d) Mj80. Thickness ~1 μm for the mid-IR film. The far-IR absorbance (dots) was scaled by x 2 to match the mid-IR.

Comparison of measured “meas” and calculated “calc.” absorption spectra of ... Available to Purchase

Published: 01 January 2004
analysis. ( a ) Py 100. Dots = mid-IR thin-film of natural pyrope. HC = hydrocarbon contaminants. F = interference fringes. O.T. = overtones. From the comparison, the pyrope films have thickness of about 0.2 μm. ( b ) Mj 39 . Thickness ~1 μm. ( c ) Mj 45 . Thickness ~0.4 μm. ( d ) Mj 80 . Thickness ~1 μm
Image
Flow chart documenting the studies that can be undertaken in the 21st century to investigate rock structures from the field scale to the nanoscale. It is envisaged that the schematically represented workflow involving petrophysical studies in sample cores, 3D fabric analysis in cores, 2D microstructural analysis in rock thin sections and nanoscale studies in thin films can help in a comprehensive analysis of structures from the meso- to nano- scale. See text for discussion.

Flow chart documenting the studies that can be undertaken in the 21 st cen... Available to Purchase

Published: 01 January 2025
, 2D microstructural analysis in rock thin sections and nanoscale studies in thin films can help in a comprehensive analysis of structures from the meso- to nano- scale. See text for discussion.
Image
Illustration of how spectral artifacts are created from light leakage using optical functions for MgO obtained from reflectivity, and calculated for thickness of 1 μm. (grey curve = thin film data, thickness approximately 1 μm). (a) Broken lines = transmission and absorbance for a perfect thin film. Solid lines = functions whereby the measurement has null transmission at the peak, from back reflections or detector noise. (b) Broken lines = transmission and absorbance for a film that covers 90% of the aperture. Solid lines = functions for 75% coverage. (c) Optical functions from reflectivity datga in Fig. 2. Solid lines = n and k from Kramers-Kronig analysis. Broken lines = classical dispersion analysis. Dash-dot line = approximately constant index of refraction of diamond. [After Figs. 2c and 6a,b of Hofmeister et al. (2003).]

Illustration of how spectral artifacts are created from light leakage using... Available to Purchase

Published: 01 January 2014
Figure 6 Illustration of how spectral artifacts are created from light leakage using optical functions for MgO obtained from reflectivity, and calculated for thickness of 1 μm. (grey curve = thin film data, thickness approximately 1 μm). (a) Broken lines = transmission and absorbance
Journal Article

The Future of Structural Geology in the 21 st Century – Moving from Mesoscale to Nanoscale Observations in Tectonically Deformed Rocks Available to Purchase

Manish A. Mamtani
Published: 01 January 2025
Jour. Geol. Soc. India (2025) 101 (1): 10–23.
DOI: https://doi.org/10.17491/jgsi/2025/174056
..., 2D microstructural analysis in rock thin sections and nanoscale studies in thin films can help in a comprehensive analysis of structures from the meso- to nano- scale. See text for discussion. ...
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View PDF for article title, The Future of Structural Geology in the 21 st Century – Moving from Mesoscale to Nanoscale Observations in Tectonically Deformed Rocks