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Journal Article

Sputter depth profiling in mineral-surface analysis Available to Purchase

Michael F. Hochella, James R. Lindsay, Victor G. Mossotti, Carrick M. Eggleston
Published: 01 December 1988
American Mineralogist (1988) 73 (11-12): 1449–1456.
...Michael F. Hochella; James R. Lindsay; Victor G. Mossotti; Carrick M. Eggleston Abstract The effects of ion bombardment on homogeneous samples of quartz, albite, calcite, and anhydrite have been studied with X-ray photoelectron spectroscopy ( xps ) in order to better understand the usefulness...
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Journal Article

XPS and LEED study of a single-crystal surface of pyrite Available to Purchase

S. Chaturvedi, R. Katz, J. Guevremont, M. A. A. Schoonen, D. R. Strongin
Published: 01 February 1996
American Mineralogist (1996) 81 (1-2): 261–264.
DOI: https://doi.org/10.2138/am-1996-1-234
...S. Chaturvedi; R. Katz; J. Guevremont; M. A. A. Schoonen; D. R. Strongin Abstract This work reports X-ray photoelectron spectroscopy (XPS) and low-energy electron diffraction (LEED) results for an as-grown (100) surface of pyrite (FeS 2 ) cleaned by low-energy He + ion bombardment and thermal...
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Journal Article

The Nature of Deformation Lamellae in Silicates Available to Purchase

H. W GREEN, II, S. V RADCLIFFE
Journal: GSA Bulletin
Published: 01 March 1972
GSA Bulletin (1972) 83 (3): 847–852.
DOI: https://doi.org/10.1130/0016-7606(1972)83[847:TNODLI]2.0.CO;2
... spaced edge dislocations. The peridotite specimen was deformed in the regime where pencil glide parallel to [100] dominates flow in olivine, and areas selected from the petrographic section were thinned to electron transparency by low-angle ion bombardment. Planar arrays of parallel edge dislocations...
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Scanning electron images obtained by backscattered electrons from TEM-specimens, which had been thinned by ion bombardment. The specimen grids have a diameter of 3.0 mm. The specimens stem from (a) 223 m, (b) 318 m, (c) 331 m, (d) 397 m, (e) 452 m and (f) 584 m depth of the borehole.

Scanning electron images obtained by backscattered electrons from TEM-speci... Available to Purchase

Published: 01 August 2011
Fig. 2. Scanning electron images obtained by backscattered electrons from TEM-specimens, which had been thinned by ion bombardment. The specimen grids have a diameter of 3.0 mm. The specimens stem from (a) 223 m, (b) 318 m, (c) 331 m, (d) 397 m, (e) 452 m and (f) 584 m depth of the borehole
Image
a. Photomicrograph (reflected light, oil immersion) of a Cu-bearing Pd–O phase (Pd–O), with abundant microcracks, located between an aggregate of hematite (Hm) and a goethite-like phase (G). Originally, the Pd–O phase had a dark grey color. It acquired a whitish color after ion bombardment. b, d. Distribution of palladium (b) and iron (d), obtained by micro-PIXE with a beam of 16 MeV Si5+ (Q = 229.4 nC). c. Distribution of hydrogen, obtained by micro-ERDA with a beam of 16 MeV Si5+ (Q = 2.03 μC).

a. Photomicrograph (reflected light, oil immersion) of a Cu-bearing Pd–O ph... Available to Purchase

Published: 01 April 2004
F ig . 1. a. Photomicrograph (reflected light, oil immersion) of a Cu-bearing Pd–O phase (Pd–O), with abundant microcracks, located between an aggregate of hematite (Hm) and a goethite-like phase (G). Originally, the Pd–O phase had a dark grey color. It acquired a whitish color after ion
Image
a. Photomicrograph (reflected light, oil immersion) of a Cu-bearing Pd–O phase (Pd–O), with abundant microcracks, located between an aggregate of hematite (Hm) and a goethite-like phase (G). Originally, the Pd–O phase had a dark grey color. It acquired a whitish color after ion bombardment. b, d. Distribution of palladium (b) and iron (d), obtained by micro-PIXE with a beam of 16 MeV Si5+ (Q = 229.4 nC). c. Distribution of hydrogen, obtained by micro-ERDA with a beam of 16 MeV Si5+ (Q = 2.03 μC).

a. Photomicrograph (reflected light, oil immersion) of a Cu-bearing Pd–O ph... Available to Purchase

Published: 01 April 2004
F ig . 1. a. Photomicrograph (reflected light, oil immersion) of a Cu-bearing Pd–O phase (Pd–O), with abundant microcracks, located between an aggregate of hematite (Hm) and a goethite-like phase (G). Originally, the Pd–O phase had a dark grey color. It acquired a whitish color after ion
Image
a. Photomicrograph (reflected light, oil immersion) of a Cu-bearing Pd–O phase (Pd–O) interstitial to crystals of platy hematite (Hm). The hematite and Pd–O phase are part of a dark encrustation on a fragment of gold (Au) that makes up a nugget of ouro preto. The whitish color of the Pd–O phase arose from ion bombardment; its original color was dark grey. b. Distribution of palladium, obtained by micro-PIXE with a beam of 16 MeV Si5+ (Q = 16.4 nC). c. Distribution of hydrogen, obtained by micro-ERDA with a beam of 16 MeV Si5+ (Q = 4 μC).

a. Photomicrograph (reflected light, oil immersion) of a Cu-bearing Pd–O ph... Available to Purchase

Published: 01 April 2004
of the Pd–O phase arose from ion bombardment; its original color was dark grey. b. Distribution of palladium, obtained by micro-PIXE with a beam of 16 MeV Si 5+ (Q = 16.4 nC). c. Distribution of hydrogen, obtained by micro-ERDA with a beam of 16 MeV Si 5+ (Q = 4 μC).
Image
(a) Cyclic voltammogram of chalcopyrite in solution at pH 9.2; peaks A–E correspond to reactions at the electrode surface. (b) O1s XPS data for the chalcopyrite surface after oxidation under conditions corresponding to A on the voltammogram; the right hand spectrum was recorded after 30 s of argon ion bombardment, and the vertical scale is counts/intensity. (c) Fe 2p XPS data for the fresh chalcopyrite surface and after oxidation under conditions corresponding to A on the voltammogram. (d) Proposed reactions during the initial oxidation of chalcopyrite (conditions corresponding to A on the voltammogram). Note that CuS2* represents a metastable surface species. (e) Model for the development of the chalcopyrite surface during oxidation. (f) AFM images of the chalcopyrite surface electrochemically oxidized at 650 mV (pH 4) with 1.45 × 1.45 μm height and deflection images shown. (a–e after Yin et al., 1995, 2000; Vaughan et al., 1995; (f) after Farquhar et al., 2002.)

( a ) Cyclic voltammogram of chalcopyrite in solution at pH 9.2; peaks A–E ... Available to Purchase

Published: 01 October 2002
after 30 s of argon ion bombardment, and the vertical scale is counts/intensity. ( c ) Fe 2p XPS data for the fresh chalcopyrite surface and after oxidation under conditions corresponding to A on the voltammogram. ( d ) Proposed reactions during the initial oxidation of chalcopyrite (conditions
Image
(a) Cyclic voltammogram of chalcopyrite in solution at pH 9.2; peaks A–E correspond to reactions at the electrode surface. (b) O1s XPS data for the chalcopyrite surface after oxidation under conditions corresponding to A on the voltammogram; the right hand spectrum was recorded after 30 s of argon ion bombardment, and the vertical scale is counts/intensity. (c) Fe 2p XPS data for the fresh chalcopyrite surface and after oxidation under conditions corresponding to A on the voltammogram. (d) Proposed reactions during the initial oxidation of chalcopyrite (conditions corresponding to A on the voltammogram). Note that CuS2* represents a metastable surface species. (e) Model for the development of the chalcopyrite surface during oxidation. (f) AFM images of the chalcopyrite surface electrochemically oxidized at 650 mV (pH 4) with 1.45 × 1.45 μm height and deflection images shown. (a–e after Yin et al., 1995, 2000; Vaughan et al., 1995; (f) after Farquhar et al., 2002.)

( a ) Cyclic voltammogram of chalcopyrite in solution at pH 9.2; peaks A–E ... Available to Purchase

Published: 01 October 2002
after 30 s of argon ion bombardment, and the vertical scale is counts/intensity. ( c ) Fe 2p XPS data for the fresh chalcopyrite surface and after oxidation under conditions corresponding to A on the voltammogram. ( d ) Proposed reactions during the initial oxidation of chalcopyrite (conditions
Image
(a) Cyclic voltammogram of chalcopyrite in solution at pH 9.2; peaks A–E correspond to reactions at the electrode surface. (b) O1s XPS data for the chalcopyrite surface after oxidation under conditions corresponding to A on the voltammogram; the right hand spectrum was recorded after 30 s of argon ion bombardment, and the vertical scale is counts/intensity. (c) Fe 2p XPS data for the fresh chalcopyrite surface and after oxidation under conditions corresponding to A on the voltammogram. (d) Proposed reactions during the initial oxidation of chalcopyrite (conditions corresponding to A on the voltammogram). Note that CuS2* represents a metastable surface species. (e) Model for the development of the chalcopyrite surface during oxidation. (f) AFM images of the chalcopyrite surface electrochemically oxidized at 650 mV (pH 4) with 1.45 × 1.45 μm height and deflection images shown. (a–e after Yin et al., 1995, 2000; Vaughan et al., 1995; (f) after Farquhar et al., 2002.)

( a ) Cyclic voltammogram of chalcopyrite in solution at pH 9.2; peaks A–E ... Available to Purchase

Published: 01 October 2002
after 30 s of argon ion bombardment, and the vertical scale is counts/intensity. ( c ) Fe 2p XPS data for the fresh chalcopyrite surface and after oxidation under conditions corresponding to A on the voltammogram. ( d ) Proposed reactions during the initial oxidation of chalcopyrite (conditions
Image
(a) Cyclic voltammogram of chalcopyrite in solution at pH 9.2; peaks A–E correspond to reactions at the electrode surface. (b) O1s XPS data for the chalcopyrite surface after oxidation under conditions corresponding to A on the voltammogram; the right hand spectrum was recorded after 30 s of argon ion bombardment, and the vertical scale is counts/intensity. (c) Fe 2p XPS data for the fresh chalcopyrite surface and after oxidation under conditions corresponding to A on the voltammogram. (d) Proposed reactions during the initial oxidation of chalcopyrite (conditions corresponding to A on the voltammogram). Note that CuS2* represents a metastable surface species. (e) Model for the development of the chalcopyrite surface during oxidation. (f) AFM images of the chalcopyrite surface electrochemically oxidized at 650 mV (pH 4) with 1.45 × 1.45 μm height and deflection images shown. (a–e after Yin et al., 1995, 2000; Vaughan et al., 1995; (f) after Farquhar et al., 2002.)

( a ) Cyclic voltammogram of chalcopyrite in solution at pH 9.2; peaks A–E ... Available to Purchase

Published: 01 October 2002
after 30 s of argon ion bombardment, and the vertical scale is counts/intensity. ( c ) Fe 2p XPS data for the fresh chalcopyrite surface and after oxidation under conditions corresponding to A on the voltammogram. ( d ) Proposed reactions during the initial oxidation of chalcopyrite (conditions
Image
(a) Cyclic voltammogram of chalcopyrite in solution at pH 9.2; peaks A–E correspond to reactions at the electrode surface. (b) O1s XPS data for the chalcopyrite surface after oxidation under conditions corresponding to A on the voltammogram; the right hand spectrum was recorded after 30 s of argon ion bombardment, and the vertical scale is counts/intensity. (c) Fe 2p XPS data for the fresh chalcopyrite surface and after oxidation under conditions corresponding to A on the voltammogram. (d) Proposed reactions during the initial oxidation of chalcopyrite (conditions corresponding to A on the voltammogram). Note that CuS2* represents a metastable surface species. (e) Model for the development of the chalcopyrite surface during oxidation. (f) AFM images of the chalcopyrite surface electrochemically oxidized at 650 mV (pH 4) with 1.45 × 1.45 μm height and deflection images shown. (a–e after Yin et al., 1995, 2000; Vaughan et al., 1995; (f) after Farquhar et al., 2002.)

( a ) Cyclic voltammogram of chalcopyrite in solution at pH 9.2; peaks A–E ... Available to Purchase

Published: 01 October 2002
after 30 s of argon ion bombardment, and the vertical scale is counts/intensity. ( c ) Fe 2p XPS data for the fresh chalcopyrite surface and after oxidation under conditions corresponding to A on the voltammogram. ( d ) Proposed reactions during the initial oxidation of chalcopyrite (conditions
Book Chapter

CHAPTER 6: IMPROVING DEPTH PROFILE MEASUREMENTS OF NATURAL MATERIALS: LESSONS LEARNED FROM ELECTRONIC MATERIALS DEPTH-PROFILING Available to Purchase

Author(s)
Jerry L. Hunter, Jr.
Book: Secondary Ion Mass Spectrometry in the Earth Sciences: Gleaning the Big Picture from a Small Spot
Series: Short Courses
Publisher: Mineralogical Association of Canada
Published: 01 January 2009
DOI: 10.3749/9780921294818.ch06
EISBN: 978-0-921294-81-8
... of the sample atoms to greater depths. Figure 6-6 shows TRIM ( Ziegler et al . 2008 ) simulations for oxygen bombardment under increasing primary ion energies. These simulations show that the increasing primary ion energy causes a larger collision cascade volume that will result in lower depth resolution...
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Journal Article

HYDROGEN IN A NATURAL Pd–O COMPOUND FROM GONGO SOCO, MINAS GERAIS, BRAZIL Available to Purchase

Alexandre Raphael Cabral, Bernd Lehmann, Dieter Grambole, Folker Herrmann
Published: 01 April 2004
The Canadian Mineralogist (2004) 42 (2): 689–694.
DOI: https://doi.org/10.2113/gscanmin.42.2.689
...F ig . 1. a. Photomicrograph (reflected light, oil immersion) of a Cu-bearing Pd–O phase (Pd–O), with abundant microcracks, located between an aggregate of hematite (Hm) and a goethite-like phase (G). Originally, the Pd–O phase had a dark grey color. It acquired a whitish color after ion...
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A cartoon of how sputtering works. The upper panel shows how atoms would move upon bombardment of a primary ion (black dot), while the lower panel shows where atoms are after 10-10 seconds of bombardment. Modified from Shimizu and Hart (1982b), modified from Williams (1979).

A cartoon of how sputtering works. The upper panel shows how atoms would mo... Available to Purchase

Published: 01 April 2019
Figure 2.3 A cartoon of how sputtering works. The upper panel shows how atoms would move upon bombardment of a primary ion (black dot), while the lower panel shows where atoms are after 10 -10 seconds of bombardment. Modified from Shimizu and Hart (1982b) , modified from Williams (1979) .
Image
Schematic illustration of the approach of secondary ionization mass spectrometry. A primary ion beam (black circles) bombards the sample, generating secondary species from a sample’s surface (gray circles). The secondary ions are extracted into the mass spectrometer where the relative mass abundances are measured.

Schematic illustration of the approach of secondary ionization mass spectro... Available to Purchase

Published: 01 January 2008
Figure 3. Schematic illustration of the approach of secondary ionization mass spectrometry. A primary ion beam (black circles) bombards the sample, generating secondary species from a sample’s surface (gray circles). The secondary ions are extracted into the mass spectrometer where the relative
Journal Article

Cathodoluminescence study of apatite crystals Available to Purchase

Jocelyn Barbarand, Maurice Pagel
Published: 01 April 2001
American Mineralogist (2001) 86 (4): 473–484.
DOI: https://doi.org/10.2138/am-2001-0411
... intensity after a specific period of time by electron bombardment, rather than the real intensity. Great care is thus required when comparing different spectra. Correlation between the areas beneath Gd 3+ and Dy 3+ CL bands and concentration, as determined by ion microprobe analysis, has been...
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Schematic diagram of a cavity ionization source designed for TIMS or quadrupole mass spectrometry, after Duan et al. (1997). a) the ion source mounted on a mass spectrometer: 1, electrodes for power supply; 2, water or air cooling tubing; 3, electron bombardment shielding can; 4, the orifice of the shielding can; 5, crucible holder; 6, crucible; 7, electron bombarding filament; 8, ion lens; 9–10, quadrupole mass spectrometer; b) a coaxial view of the source, with same components as in a), c) tungsten crucibles used for the thermal ionization source. Top diagram illustrates a crucible for an isotope separator, bottom is the crucible for a quadrupole or magnetic sector spectrometer. 1, ionization channel; 2, crucible cap. Dimensions for the smaller thermal ionization crucible are 0.02 cm diameter and 1 cm depth. Ionization efficiency for many elements (ng to ug) is improved by at least an order of magnitude relative to standard filaments, although backgrounds can also be elevated relative to standard methods and need to be carefully evaluated. [Used by permission of Elsevier Science, from Duan et al. (1997), Int J Mass Spectrom Ion Processes, Vol. 161, Figs. 1 & 2, p. 29 & 30]

Schematic diagram of a cavity ionization source designed for TIMS or quadru... Available to Purchase

Published: 01 January 2003
Figure 4. Schematic diagram of a cavity ionization source designed for TIMS or quadrupole mass spectrometry, after Duan et al. (1997) . a) the ion source mounted on a mass spectrometer: 1, electrodes for power supply; 2, water or air cooling tubing; 3, electron bombardment shielding can; 4
Book Chapter

CHAPTER 1: AN INTRODUCTION TO SECONDARY ION MASS SPECTROMETRY (SIMS) IN GEOLOGY Available to Purchase

Author(s)
Richard A. Stern
Book: Secondary Ion Mass Spectrometry in the Earth Sciences: Gleaning the Big Picture from a Small Spot
Series: Short Courses
Publisher: Mineralogical Association of Canada
Published: 01 January 2009
DOI: 10.3749/9780921294818.ch01
EISBN: 978-0-921294-81-8
...INTRODUCTION The basis of the secondary ion mass spectrometry (SIMS) technique is the phenomenon where bombardment of a solid by a primary ion beam generates secondary ions. The secondary ions, analyzed for their mass-to-charge (m/z) ratios in a mass spectrometer, in turn reflect some...
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Journal Article

BOLEITE: RESOLUTION OF THE FORMULA, K Pb 26 Ag 9 Cu 24 Cl 62 (OH) 48 Available to Purchase

Mark A. Cooper, Frank C. Hawthorne
Published: 01 August 2000
The Canadian Mineralogist (2000) 38 (4): 801–808.
DOI: https://doi.org/10.2113/gscanmin.38.4.801
... volumineuse dans la structure. A notre avis, le bombardement par le faisceau d’électrons est probablement la cause d’une migration rapide des ions K. La spectroscopie dans l’infrarouge montre qu’il n’y a pas de molécules de H 2 O dans la structure. Les sites H ont été localisés au cours de l’affinement...
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