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Transmission electron microscopy of interfaces and defects in intergrown pyroxenes

Kenneth J. T. Livi and David R. Veblen
Transmission electron microscopy of interfaces and defects in intergrown pyroxenes
American Mineralogist (October 1989) 74 (9-10): 1070-1083

Abstract

High-resolution and conventional TEM have been used to study exsolved augites from the Laramie anorthosite complex, and the HRTEM images have been interpreted through extensive computer- generated image simulations. The results illustrate the complexity of interface structures and morphologies in exsolved pyroxenes and confirm that defects such as dislocations and stacking faults play an important role in pyroxene exsolution processes.


ISSN: 0003-004X
EISSN: 1945-3027
Coden: AMMIAY
Serial Title: American Mineralogist
Serial Volume: 74
Serial Issue: 9-10
Title: Transmission electron microscopy of interfaces and defects in intergrown pyroxenes
Affiliation: Johns Hopkins Univ., Dep. Earth and Planet. Sci., Baltimore, MD, United States
Pages: 1070-1083
Published: 198910
Text Language: English
Publisher: Mineralogical Society of America, Washington, DC, United States
References: 45
Accession Number: 1990-013337
Categories: Mineralogy of silicates
Document Type: Serial
Bibliographic Level: Analytic
Illustration Description: illus. incl. 1 table
Country of Publication: United States
Secondary Affiliation: GeoRef, Copyright 2017, American Geosciences Institute. Reference includes data from Mineralogical Abstracts, United KingdomTwickenhamUKUnited Kingdom
Update Code: 1990
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