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Trace element diffusion in rhyolitic melts; comparison between synchrotron radiation X-ray fluorescence microanalysis (mu -SRXRF) and secondary ion mass spectrometry (SIMS)

Matthias Hahn, Harald Behrens, Astrid Tegge-Schuering, Juergen Koepke, Ingo Horn, Karen Rickers, Gerald Falkenberg and Michael Wiedenbeck
Trace element diffusion in rhyolitic melts; comparison between synchrotron radiation X-ray fluorescence microanalysis (mu -SRXRF) and secondary ion mass spectrometry (SIMS) (in EMPG X; Experimental mineralogy, petrology and geochemistry, A. B. Woodland (editor) and S. F. Foley (editor))
European Journal of Mineralogy (April 2005) 17 (2): 233-242

Abstract

Two microbeam techniques, synchrotron radiation X-ray fluorescence micro-analysis (mu -SRXRF) and secondary ion mass spectrometry (SIMS) are compared for analyzing diffusion profiles of trace elements in two hydrous rhyolitic glasses (1.87 and 5.00 wt% H (sub 2) O). In order to verify the results, laser ablation coupled to inductively coupled plasma optical emission (LA-ICP-OES) has been used on one sample. Samples were produced by diffusion couple experiments performed in an internally heated gas pressure vessel at 1200 degrees C and 500MPa. One half of each couple was doped with 24 trace elements representing different geochemical groups: low field strength elements (Rb, Sr, Ba), transition metals (Cr, Co, Ni, Cu, Zn), rare earth elements (La, Ce, Nd, Sm, Eu, Gd, Er, Yb) + Y, high field strength elements (V, Zr, Nb, Hf, Ta) and main group elements (Ge, Sn). Several profiles were measured with both mu -SRXRF and SIMS on both samples. In principle, concentrations of all elements can be extracted simultaneously from a single SRXRF spectrum. However, some trace elements could not be reliably quantified with our analytical system: Ta and Pb (used for detector collimator material), Ti, V (low energy of K (sub alpha ) ), Co (K (sub alpha ) -peak overlapping with Fe K (sub beta ) -peak) and Cr, Ni, Cu, Zn (overlapping with l-lines of REEs). In contrast, SIMS analyses measure each element sequentially. Hence, not all elements of the large total set of trace elements could be analyzed in a single run. Some elements requiring a high mass resolution (NaSi interfering with V, CaO interfering with Ni) or having low yields (Sn) were not profiled. Multiple diffusivities derived from mu -SRXRF and SIMS profiles are in very good agreement for most elements. In general, the trace element diffusivity decreases with increasing valence state, e.g. in sample D22 containing 1.87 wt% H (sub 2) O from log D=-10.80 for the monovalent Rb to log D=-13.34 for the tetravalent Zr (Dinm (super 2) /s). By increasing the water content in sample D18 to 5.00 wt%, diffusion coefficients increase approximately by one order of magnitude for all elements studied.


ISSN: 0935-1221
EISSN: 1617-4011
Serial Title: European Journal of Mineralogy
Serial Volume: 17
Serial Issue: 2
Title: Trace element diffusion in rhyolitic melts; comparison between synchrotron radiation X-ray fluorescence microanalysis (mu -SRXRF) and secondary ion mass spectrometry (SIMS)
Title: EMPG X; Experimental mineralogy, petrology and geochemistry
Affiliation: Universitaet Hannover, Institut fuer Mineralogie, Hanover, Federal Republic of Germany
Pages: 233-242
Published: 200504
Text Language: English
Publisher: Schweizerbart'sche Verlagsbuchhandlung (Naegele u. Obermiller), Stuttgart, Federal Republic of Germany
Meeting name: 10th international symposium on Experimental mineralogy, petrology and geochemistry
Meeting location: Frankfurt, DEU, Federal Republic of Germany
Meeting date: 20040404April 4-7, 2004
References: 57
Accession Number: 2005-041697
Categories: General geochemistry
Document Type: Serial Conference document
Bibliographic Level: Analytic
Illustration Description: illus. incl. 2 tables
Secondary Affiliation: Hamburger Synchrotron-Strahlungslabor HASYLAB at Deutsches Elektronen-Synchrotron DESY, DEU, Federal Republic of GermanyGeoForschungsZentrum Potsdam, DEU, Federal Republic of Germany
Country of Publication: Germany
Secondary Affiliation: GeoRef, Copyright 2017, American Geosciences Institute.
Update Code: 200525
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