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A new tool to treat peak overlaps in electron-probe microanalysis of rare-earth-element L-series X-rays

Michel Fialin, Michel Outrequin and Pierre-Francois Staub
A new tool to treat peak overlaps in electron-probe microanalysis of rare-earth-element L-series X-rays
European Journal of Mineralogy (October 1997) 9 (5): 965-968

Abstract

An empirical method for X-ray data processing is presented for the treatment of peak overlaps in EPMA, and tested on the complex L-spectra of compounds containing REE. The estimated minimum detection limits are better than 0.1 wt. %. The method can be readily incorporated in computer software for on-line quantitative analysis.


ISSN: 0935-1221
Serial Title: European Journal of Mineralogy
Serial Volume: 9
Serial Issue: 5
Title: A new tool to treat peak overlaps in electron-probe microanalysis of rare-earth-element L-series X-rays
Affiliation: Universite P. & M. Curie, CNRS, Paris, France
Pages: 965-968
Published: 199710
Text Language: English
Publisher: Schweizerbart'sche Verlagsbuchhandlung (Naegele u. Obermiller), Stuttgart, Federal Republic of Germany
References: 7
Accession Number: 1997-077045
Categories: Geochemistry of rocks, soils, and sediments
Document Type: Serial
Bibliographic Level: Analytic
Illustration Description: 5 tables
Secondary Affiliation: CAMECA, FRA, France
Country of Publication: Germany
Secondary Affiliation: GeoRef, Copyright 2017, American Geosciences Institute. Reference includes data from Mineralogical Abstracts, United KingdomTwickenhamUKUnited Kingdom
Update Code: 199724
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