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High energy ion beams; useful probes for mineral chemical analysis

Shigeho Sueno
High energy ion beams; useful probes for mineral chemical analysis
European Journal of Mineralogy (December 1995) 7 (6): 1273-1297

Abstract

The bombardment of a MeV-range high-energy ion beam on a target material induces many types of particles and radiation. The detection of these emissions makes possible a wide variety of analytical methods suitable for the chemical analysis of minerals. These ion beam analyses, e.g. PIXE, RBS, NRA, PIGE, PAA, have many advantages in comparison with electron beam probe analytical methods, such as EPMA, TEM and SEM. For example, ion beam analysis has unique capabilities for trace element analysis, light element analysis, depth profile analysis, external beam analysis, channelling analysis, ion beam induced luminescence, subsurface fluid inclusion analysis and accelerator MS. The basis of each technique and recent progress on mineralogical applications are reviewed.


ISSN: 0935-1221
Serial Title: European Journal of Mineralogy
Serial Volume: 7
Serial Issue: 6
Title: High energy ion beams; useful probes for mineral chemical analysis
Author(s): Sueno, Shigeho
Affiliation: University of Tsukuba, Institute of Geoscience, Tsukuba, Japan
Pages: 1273-1297
Published: 199512
Text Language: English
Publisher: Schweizerbart'sche Verlagsbuchhandlung (Naegele u. Obermiller), Stuttgart, Federal Republic of Germany
References: 84
Accession Number: 1996-014801
Categories: Geochemistry of rocks, soils, and sediments
Document Type: Serial
Bibliographic Level: Analytic
Illustration Description: illus. incl. 3 tables
Country of Publication: Germany
Secondary Affiliation: GeoRef, Copyright 2017, American Geosciences Institute. Reference includes data from Mineralogical Abstracts, United KingdomTwickenhamUKUnited Kingdom
Update Code: 199606
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