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X-ray absorption spectroscopy of silicon dioxide (SiO (sub 2) ) polymorphs; the structural characterization of opal
Dien Li, G. M. Bancroft, M. Kasrai, M. E. Fleet, R. A. Secco, X. H. Feng, K. H. Tan and B. X. Yang
X-ray absorption spectroscopy of silicon dioxide (SiO (sub 2) ) polymorphs; the structural characterization of opal
American Mineralogist (August 1994) 79 (7-8): 622-632
X-ray absorption spectroscopy of silicon dioxide (SiO (sub 2) ) polymorphs; the structural characterization of opal
American Mineralogist (August 1994) 79 (7-8): 622-632
Index Terms/Descriptors
Abstract
This paper presents high-resolution SiK- and SiL-edge XANES and SiK-edge EXAFS of 6:3-coordinated stishovite and 4:2-coordinated alpha -quartz, alpha -cristobalite, coesite, amorphous SiO (sub 2) and opals and uses the spectra to infer the unoccupied electronic states of these forms of silica (SiO (sub 2) ).
ISSN: 0003-004X
EISSN: 1945-3027
Coden: AMMIAY
Serial Title: American Mineralogist
Serial Volume: 79
Serial Issue: 7-8
Title: X-ray absorption spectroscopy of silicon dioxide (SiO (sub 2) ) polymorphs; the structural characterization of opal
Author(s): Li, DienBancroft, G. M.Kasrai, M.Fleet, M. E.Secco, R. A.Feng, X. H.Tan, K. H.Yang, B. X.
Affiliation: University of Western Ontario, Department of Chemistry,
London, ON,
Canada
Pages: 622-632
Published: 199408
Text Language: English
Publisher: Mineralogical Society of America,
Washington, DC,
United States
References: 50
Accession Number: 1994-047744
Categories: Mineralogy of silicates
Document Type: Serial
Bibliographic Level: Analytic
Illustration Description: illus. incl. 3 tables
Secondary Affiliation: University of Wisconsin at Madison,
USA,
United States
Country of Publication: United States
Secondary Affiliation: GeoRef, Copyright 2017, American Geosciences Institute. Reference includes data from Mineralogical Abstracts, United KingdomTwickenhamUKUnited Kingdom
Update Code: 199422
