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Rietveld refinement of crystal structures using powder X-ray diffraction data

Jeffrey E. Post and David L. Bish
Rietveld refinement of crystal structures using powder X-ray diffraction data (in Modern powder diffraction, David L. Bish (editor) and Jeffrey E. Post (editor))
Reviews in Mineralogy (1989) 20: 277-308

Abstract

The introduction of computer-automated diffractometers to collect routinely digitized data using a step-scan procedure, when combined with the Rietveld refinement method to powder XRD data, which at least in part circumvents the peak overlap problem, has yielded successful refinements of crystal structures. Examples are given of the use of such methods to refine the structures of zeolites, kaolinite and hollandite.


ISSN: 0275-0279
Coden: RMINDF
Serial Title: Reviews in Mineralogy
Serial Volume: 20
Title: Rietveld refinement of crystal structures using powder X-ray diffraction data
Title: Modern powder diffraction
Author(s): Post, Jeffrey E.Bish, David L.
Author(s): Bish, David L.editor
Author(s): Post, Jeffrey E.editor
Affiliation: Smithson. Inst., Dep. Miner. Sci., Washington, DC, United States
Affiliation: Va. Polytech. Inst. and State Univ., Dep. Geol. Sci., Blacksburg, VA, United States
Pages: 277-308
Published: 1989
Text Language: English
Publisher: Mineralogical Society of America, Washington, DC, United States
ISBN: 0-939950-24-3
References: 100
Accession Number: 1991-004223
Categories: General mineralogy
Document Type: Serial
Bibliographic Level: Analytic
Illustration Description: illus. incl. 9 tables
Secondary Affiliation: Los Alamos Natl. Lab., USA, United States
Country of Publication: United States
Secondary Affiliation: GeoRef, Copyright 2017, American Geosciences Institute. Reference includes data from Mineralogical Abstracts, United KingdomTwickenhamUKUnited Kingdom
Update Code: 1991
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