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GEOREF RECORD

Sample preparation for X-ray diffraction

David L. Bish and R. C. Reynolds
Sample preparation for X-ray diffraction (in Modern powder diffraction, David L. Bish (editor) and Jeffrey E. Post (editor))
Reviews in Mineralogy (1989) 20: 73-99

Abstract

Although for a qualitative analysis of a simple, familiar material, quick grinding in a hand mortar and pestle followed by packing into a cavity-type sample holder can be sufficient, the analysis of complex materials involving search/match procedures, quantitative phase analysis, lattice-parameter refinement or Rietveld refinement of crystal structures requires careful attention to the method and execution of sample preparation and mounting. The preparation of oriented clay mineral aggregates and special sample preparation techniques are also discussed.


ISSN: 0275-0279
Coden: RMINDF
Serial Title: Reviews in Mineralogy
Serial Volume: 20
Title: Sample preparation for X-ray diffraction
Title: Modern powder diffraction
Author(s): Bish, David L.Reynolds, R. C., Jr.
Author(s): Bish, David L.editor
Author(s): Post, Jeffrey E.editor
Affiliation: Los Alamos Natl. Lab., Earth Environ. Sci. Div., Los Alamos, NM, United States
Affiliation: Va. Polytech. Inst. and State Univ., Dep. Geol. Sci., Blacksburg, VA, United States
Pages: 73-99
Published: 1989
Text Language: English
Publisher: Mineralogical Society of America, Washington, DC, United States
ISBN: 0-939950-24-3
References: 50
Accession Number: 1991-004218
Categories: General mineralogy
Document Type: Serial
Bibliographic Level: Analytic
Illustration Description: illus. incl. 1 table
Secondary Affiliation: Dartmouth Coll., USA, United States
Country of Publication: United States
Secondary Affiliation: GeoRef, Copyright 2017, American Geosciences Institute. Reference includes data from Mineralogical Abstracts, United KingdomTwickenhamUKUnited Kingdom
Update Code: 1991
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