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The SEM examination of geological samples with a semiconductor backscattered-electron detector; discussion and reply

Bruce W. Robinson, Ernest H. Nickel, M. G. Hall and G. E. Lloyd
The SEM examination of geological samples with a semiconductor backscattered-electron detector; discussion and reply
American Mineralogist (August 1983) 68 (7-8): 840-844

Abstract

In a discussion of a previously published paper, the authors describe the advantages they find in the scintillator backscattered-electron/low-vacuum techniques of SEM.


ISSN: 0003-004X
EISSN: 1945-3027
Coden: AMMIAY
Serial Title: American Mineralogist
Serial Volume: 68
Serial Issue: 7-8
Title: The SEM examination of geological samples with a semiconductor backscattered-electron detector; discussion and reply
Affiliation: CSIRO, Div. Mineral., Wembley, W.A., Australia
Pages: 840-844
Published: 198308
Text Language: English
Publisher: Mineralogical Society of America, Washington, DC, United States
References: 18
Accession Number: 1984-002331
Categories: General mineralogy
Document Type: Serial
Bibliographic Level: Analytic
Annotation: For reference to paper by Hall, M. G., and Lloyd, G. E., see Am. Mineral., Vol. 66, p. 362, 1981
Secondary Affiliation: Univ. Birmingham, GBR, United Kingdom
Country of Publication: United States
Secondary Affiliation: GeoRef, Copyright 2017, American Geosciences Institute. Reference includes data from Mineralogical Abstracts, United KingdomTwickenhamUKUnited Kingdom
Update Code: 1984
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