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Modulated and intergrowth structures in minerals and electron microscope methods for their study

Peter R. Buseck and John M. Cowley
Modulated and intergrowth structures in minerals and electron microscope methods for their study (in Real behavior in minerals; the integration of theory and technique, Anonymous)
American Mineralogist (February 1983) 68 (1-2): 18-40

Abstract

Transmission electron microscopy. High-resolution imaging permits direct observation of structural fluctuations, whereas electron diffraction provides a highly sensitive probe of larger regions. Microanalysis using the electron beam holds potential for detecting and measuring compositional differences across small regions.--Modified journal abstract.


ISSN: 0003-004X
EISSN: 1945-3027
Coden: AMMIAY
Serial Title: American Mineralogist
Serial Volume: 68
Serial Issue: 1-2
Title: Modulated and intergrowth structures in minerals and electron microscope methods for their study
Title: Real behavior in minerals; the integration of theory and technique
Author(s): Buseck, Peter R.Cowley, John M.
Author(s): Anonymous
Affiliation: Ariz. State Univ., Dep. Geol., Tempe, AZ, United States
Pages: 18-40
Published: 198302
Text Language: English
Publisher: Mineralogical Society of America, Washington, DC, United States
Meeting name: Mineralogical Society of America symposium on Real behavior in minerals, the integration of theory and technique; a part of The Geological Society of America, 94th annual meeting
Meeting location: Cincinnati, OH, USA, United States
Meeting date: 19811104Nov. 4, 1981
References: 60
Accession Number: 1983-034743
Categories: General mineralogy
Document Type: Serial Conference document
Bibliographic Level: Analytic
Illustration Description: illus. incl. 2 tables
Country of Publication: United States
Secondary Affiliation: GeoRef, Copyright 2017, American Geosciences Institute.
Update Code: 1983
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