Present-day techniques to estimate the traveltime parameters of the common-reflection-surface (CRS) stack are tedious, time-consuming, and expensive processes based on local coherence analyses along a large number of trial surfaces. We demonstrate for the 2D CRS method that faster and cheaper determination is possible. The complete set of CRS parameters can be extracted from seismic data by an application of modern local-slope-extraction techniques. The necessary information about the CRS parameters is contained in the slopes of the common-midpoint section at the central point and one or several common-offset sections in its vicinity. We discuss two procedures for the CRS parameter extraction technique. Their difference lies in the way the common-offset parameters are determined. One technique requires slope-derivative information (a possible source of instability); the other uses slope information at two different locations and less data redundancy. As demonstrated by a synthetic data example, the procedures are sufficiently robust to allow for high-quality extraction of all CRS parameters from the extracted slope fields. In this way, the CRS parameter extraction can be sped up by several orders of magnitude as compared to the conventional procedure based on coherence analysis along trial surfaces.

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