This is a comprehensive and well-organized guide to scanning electron microscopy (SEM) and X-ray microanalysis. The authors have aimed to keep apace with recent developments in SEM since the publication of the second edition in 1992, and have updated it accordingly, including sections on topics such as variable pressure/environmental SEM, and crystallographic analysis of specimens using electron backscatter diffraction.

The book, complete with CD, sets out the mechanics of the electron microscope, how images are formed and their interpretation, X-ray microanalysis and X-ray production, and the preparation and analysis of samples of differing composition. There are informative summaries on several...

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