Random distribution of Ge and Si in synthetic talc; an EXAFS and FTIR study

Francois Martin; Philippe Ildefonse; Jean-Louis Hazemann; Sabine Petit; Olivier Grauby; Alain Decarreau

Francois Martin;

Francois Martin

Universite de Poitiers, Laboratoire de Petrologie de la Surface, Poitiers, France

Search for other works by this author on:

GSW

Google Scholar

Philippe Ildefonse;

Philippe Ildefonse

Search for other works by this author on:

GSW

Google Scholar

Jean-Louis Hazemann;

Jean-Louis Hazemann

Search for other works by this author on:

GSW

Google Scholar

Sabine Petit;

Sabine Petit

Search for other works by this author on:

GSW

Google Scholar

Olivier Grauby;

Olivier Grauby

Search for other works by this author on:

GSW

Google Scholar

Alain Decarreau

Search for other works by this author on:

GSW

Google Scholar

Francois Martin

Universite de Poitiers, Laboratoire de Petrologie de la Surface, Poitiers, France

Philippe Ildefonse

Jean-Louis Hazemann

Sabine Petit

Olivier Grauby

Alain Decarreau

Publisher: Deutsche Mineralogische Gesellschaft, Sociedad Española de Mineralogia, Societá Italiana di Mineralogia e Petrologia, Société Francaise de Minéralogie

First Online: 02 Mar 2017

Online Issn: 1617-4011

Print Issn: 0935-1221

European Journal of Mineralogy (1996) 8 (2): 289–299.

You do not have access to this content, please speak to your institutional administrator if you feel you should have access.

Random distribution of Ge and Si in synthetic talc; an EXAFS and FTIR study

First Page Preview

Email alerts

Citing articles via

About GSW

Resources

Explore

Connect

Random distribution of Ge and Si in synthetic talc; an EXAFS and FTIR study

First Page Preview

Email alerts

Citing articles via

About GSW

Resources

Explore

Connect

This Feature Is Available To Subscribers Only