Crystallographic images processing (CIP) and high-resolution transmission electron microscopy (HRTEM) studies of bannisterite; a 2:1 type modulated layer silicate

Embaie A. Ferrow; Sven Hovmoeller

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Other| February 01, 1993

Crystallographic images processing (CIP) and high-resolution transmission electron microscopy (HRTEM) studies of bannisterite; a 2:1 type modulated layer silicate

Embaie A. Ferrow;

Embaie A. Ferrow

Lund University, Department of Mineralogy and Petrology, Institute of Geology, Lund, Sweden

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Sven Hovmoeller

Stockholm University, Sweden

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Author and Article Information

Embaie A. Ferrow

Lund University, Department of Mineralogy and Petrology, Institute of Geology, Lund, Sweden

Sven Hovmoeller

Stockholm University, Sweden

Publisher: Deutsche Mineralogische Gesellschaft, Sociedad Española de Mineralogia, Societá Italiana di Mineralogia e Petrologia, Société Francaise de Minéralogie

First Online: 02 Mar 2017

Online ISSN: 1617-4011

Print ISSN: 0935-1221

European Journal of Mineralogy (1993) 5 (1): 181–188.

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Crystallographic images processing (CIP) and high-resolution transmission electron microscopy (HRTEM) studies of bannisterite; a 2:1 type modulated layer silicate

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