X-ray photoelectron spectroscopy (XPS) used as a structural and chemical surface probe on aluminosilicate minerals

Giuseppe G. Biino; Pierangelo Groening

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Other| June 01, 1998

X-ray photoelectron spectroscopy (XPS) used as a structural and chemical surface probe on aluminosilicate minerals

Giuseppe G. Biino;

Giuseppe G. Biino

University of Fribourg, Institute of Mineralogy and Petrography, Perolles, Switzerland

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Pierangelo Groening

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Author and Article Information

Giuseppe G. Biino

University of Fribourg, Institute of Mineralogy and Petrography, Perolles, Switzerland

Pierangelo Groening

Publisher: Deutsche Mineralogische Gesellschaft, Sociedad Española de Mineralogia, Societá Italiana di Mineralogia e Petrologia, Société Francaise de Minéralogie

First Online: 02 Mar 2017

Online ISSN: 1617-4011

Print ISSN: 0935-1221

European Journal of Mineralogy (1998) 10 (3): 423–437.

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X-ray photoelectron spectroscopy (XPS) used as a structural and chemical surface probe on aluminosilicate minerals

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