X-ray photoelectron spectroscopy (XPS) used as a structural and chemical surface probe on aluminosilicate minerals

Giuseppe G. Biino; Pierangelo Groening

Giuseppe G. Biino;

Giuseppe G. Biino

University of Fribourg, Institute of Mineralogy and Petrography, Perolles, Switzerland

Search for other works by this author on:

GSW

Google Scholar

Pierangelo Groening

Search for other works by this author on:

GSW

Google Scholar

Giuseppe G. Biino

University of Fribourg, Institute of Mineralogy and Petrography, Perolles, Switzerland

Pierangelo Groening

Publisher: Deutsche Mineralogische Gesellschaft, Sociedad Española de Mineralogia, Societá Italiana di Mineralogia e Petrologia, Société Francaise de Minéralogie

First Online: 02 Mar 2017

Online Issn: 1617-4011

Print Issn: 0935-1221

European Journal of Mineralogy (1998) 10 (3): 423–437.

You do not have access to this content, please speak to your institutional administrator if you feel you should have access.

X-ray photoelectron spectroscopy (XPS) used as a structural and chemical surface probe on aluminosilicate minerals

First Page Preview

Email alerts

Citing articles via

About GSW

Resources

Explore

Connect

X-ray photoelectron spectroscopy (XPS) used as a structural and chemical surface probe on aluminosilicate minerals

First Page Preview

Email alerts

Citing articles via

About GSW

Resources

Explore

Connect

This Feature Is Available To Subscribers Only