Several artefacts occurring during TEM sample preparation by ion-milling and observation, which cannot be straightforwardly discerned from genuine properties of the sample, are presented and discussed, with the aim to warn unexperienced microscopists against misinterpretation of TEM data. The cases presented here span from typical material sputtering and redeposition during ion-milling sample preparation, or sample decomposition under the electron beam, to more exotic cases of sample recrystallization during observation or during storage within the grid box. Overall, 15 different case studies, categorized among artefacts produced during (i) preparation, (ii) observation, (iii) microanalysis and (iv) sample storage are illustrated and discussed. The paper ends with recommendations on how minimize both preparation- and observation-induced artefacts, with specific mention to minerals.
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Research Article|
September 01, 2019
Bizarre artefacts in transmission electron microscopy preparation and observation of geological samples
Giancarlo Capitani
1
Department of Earth and Environmental Sciences, University of Milano-Bicocca
, Piazza Della Scienza 4, 20126Milan, Italy
Corresponding author, e-mail: [email protected]
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Corresponding author, e-mail: [email protected]
Publisher: Deutsche Mineralogische Gesellschaft, Sociedad Española de Mineralogia, Societá Italiana di Mineralogia e Petrologia, Société Francaise de Minéralogie
Received:
30 Apr 2019
Revision Received:
21 Jul 2019
Accepted:
22 Jul 2019
First Online:
25 Sep 2019
Online ISSN: 1617-4011
Print ISSN: 0935-1221
© 2019 E. Schweizerbart’sche Verlagsbuchhandlung, 70176 Stuttgart, Germany
European Journal of Mineralogy (2019) 31 (5-6): 857–873.
Article history
Received:
30 Apr 2019
Revision Received:
21 Jul 2019
Accepted:
22 Jul 2019
First Online:
25 Sep 2019
Citation
Giancarlo Capitani; Bizarre artefacts in transmission electron microscopy preparation and observation of geological samples. European Journal of Mineralogy 2019;; 31 (5-6): 857–873. doi: https://doi.org/10.1127/ejm/2019/0031-2893
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Index Terms/Descriptors
- aluminum oxides
- amorphous materials
- Brachiopoda
- carbonates
- carborundum
- chain silicates
- clinopyroxene
- cordierite
- damage
- diamond
- EDS spectra
- electron microscopy data
- experimental studies
- fluorides
- halides
- nanoparticles
- native elements
- nesosilicates
- orthosilicates
- oxides
- parisite
- perovskite
- pyrite
- pyroxene group
- recrystallization
- ring silicates
- sample preparation
- SEM data
- sheet silicates
- silicates
- spectra
- sulfides
- TEM data
- transmission electron microscopy
- X-ray spectra
- boltwoodite
- ion milling
- kirschteinite
- focused ion beam
- nepouite
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