A simulated quartz fabric is generated in which the c axes tend to be parallel to a single direction. A set of pole figures is computed corresponding to the pole figures that would be measured by X-ray fabric analysis. Comparisons are made between orientation diagrams derived from the "measured" pole figures both directly and via the orientation function. The derived pole figures and inverse pole figures and the crystal orientation matrix obtained by the direct method correlate more closely with the original, simulated data. The inverse pole figures derived from the orientation distribution function display spurious symmetry indicating nonexistent differences in equivalent specimen directions and in the orientation patterns of positive and negative crystallographic forms. It is demonstrated that the analysis and comparison of pole figures require that the number of faces belonging to the crystallographic forms represented in the pole figure must be taken into consideration. Further, where more than one form is present and the data are obtained by X-ray diffraction, the relative diffracting intensities must also be considered. This leads to the formulation of an effective multiplicity factor.