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Book Chapter

Characterization of dislocations and deformation processes by Transmission Electron Microscopy

By
Patrick Cordier
Patrick Cordier
University of Lille, Unité Matériaux et Transformations UMR CNRS 8207, 59655 Villeneuve d’Ascq Cedex, France
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Published:
January 01, 2013

Abstract

Dislocations can be seen either as a linear domain of a crystal where atoms are misplaced, or through their long-range elastic strain fields. Transmission electron microscopy is sensitive to both aspects. Atomic-scale configurations within the dislocation cores can be imaged directly by high-resolution transmission electron microscopy and scanning transmission electron microscopy. On the other hand, the long-range lattice distortions induced in the crystal by dislocations give rise to a diffraction contrast in conventional transmission electron microscopy which can be used to image dislocation microstructures or to characterize their Burgers vectors. This chapter reviews the experimental techniques available in transmission electron microscopy to image and characterize dislocations.

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Contents

European Mineralogical Union Notes in Mineralogy 14

Minerals at the Nanoscale

F. Nieto
F. Nieto
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K.J.T. Livi
K.J.T. Livi
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R. Oberti
R. Oberti
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Mineralogical Society of Great Britain and Ireland
ISBN electronic:
9780903056380
Publication date:
January 01, 2013

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