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Energy dispersive X-ray microanalysis by TEM applied to extraterrestrial materials

By
Hugues Leroux
Hugues Leroux
Unité Matériaux et Transformations, UMR 8207, Université Lille 1 & CNRS, 59655 Villeneuve d’Ascq, France
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Published:
January 01, 2013

Abstract

Energy dispersive X-ray microanalysis of thin specimens in a transmission electron microscope is a valuable method for investigating the chemistry of the nano-scale structure of rocks and minerals. This chapter summarizes first the key elements of this technique, including X-ray generation from the specimen, the detection chain and the quantification of spectra collected. The second part of the chapter is devoted to applications of the technique to extraterrestrial objects (Martian meteorites, cometary dust, primitive chondrites). Through examples, the different EDX working modes are illustrated (spot analysis, line profile, element map). Beam-damage issues are also discussed.

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Contents

European Mineralogical Union Notes in Mineralogy 14

Minerals at the Nanoscale

F. Nieto
F. Nieto
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K.J.T. Livi
K.J.T. Livi
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R. Oberti
R. Oberti
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Mineralogical Society of Great Britain and Ireland
ISBN electronic:
9780903056380
Publication date:
January 01, 2013

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