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Porosity in shale samples is often at such a small scale that analysis with a focused ion-beam scanning electron microscope (FIB-SEM) is needed to resolve the nanometer-size pores in three dimensions. This gain in resolution, however, comes at the expense of analysis volume (typically no more than 1000 um3), which may not be representative of the larger sample. This paper describes a method of creating high-resolution, large-scale SEM images to aid in selecting more representative locations for FIB-SEM imaging and analysis than by current industry practice.

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