Skip to Main Content

Abstract

Porosity in shale samples is often at such a small scale that analysis with a focused ion-beam scanning electron microscope (FIB-SEM) is needed to resolve the nanometer-size pores in three dimensions. This gain in resolution, however, comes at the expense of analysis volume (typically no more than 1000 um3), which may not be representative of the larger sample. This paper describes a method of creating high-resolution, large-scale SEM images to aid in selecting more representative locations for FIB-SEM imaging and analysis than by current industry practice.

You do not currently have access to this chapter.

Figures & Tables

Contents

GeoRef

References

Related

Citing Books via

Close Modal
This Feature Is Available To Subscribers Only

Sign In or Create an Account

Close Modal
Close Modal